A recent study conducted by the research team at Hefei Institutes of Physical Science of the Chinese Academy of Sciences, has introduced a new method for enhancing X-ray detection by incorporating out-of-phase CsPb2Br5 perovskite into CsPbBr3 bulk material.
A recent study conducted by the research team at Hefei Institutes of Physical Science of the Chinese Academy of Sciences, has introduced a new method for enhancing X-ray detection by incorporating out-of-phase CsPb2Br5 perovskite into CsPbBr3 bulk material.
«We achieved really good sensitivity for detecting X-rays (2.58×105 μC Gyair-1 cm-2), and a low detection limit (127.9 nGyair-1),» said Prof. Pan Xu, who led the team, «We also integrated this technique with a thin-film transistor (TFT) plate to make X-ray images.»
The relevant results were published in Advanced Functional Materials.
